Please use this identifier to cite or link to this item: https://idr.l3.nitk.ac.in/jspui/handle/123456789/10715
Title: Effect of cadmium incorporation on the properties of zinc oxide thin films
Authors: Bharath, S.P.
Bangera, K.V.
Shivakumar, G.K.
Issue Date: 2018
Citation: Applied Nanoscience (Switzerland), 2018, Vol.8, 43862, pp.187-193
Abstract: Cd x Zn 1-x O (0 ? x ? 0.20) thin films are deposited on soda lime glass substrates using spray pyrolysis technique. To check the thermal stability, Cd x Zn 1-x O thin films are subjected to annealing. Both the as-deposited and annealed Cd x Zn 1-x O thin films are characterized using X-ray diffraction (XRD), scanning electron microscope (SEM) and energy-dispersive X-ray analysis (EDAX) to check the structural, surface morphological and compositional properties, respectively. XRD analysis reveals that the both as-deposited and annealed Cd x Zn 1-x O thin films are (002) oriented with wurtzite structure. SEM studies confirm that as-deposited, as well as annealed Cd x Zn 1-x O thin films are free from pinholes and cracks. Compositional analysis shows the deficiency in Cd content after annealing. Optical properties evaluated from UV-Vis spectroscopy shows red shift in the band gap for Cd x Zn 1-x O thin films. Electrical property measured using two probe method shows a decrease in the resistance after Cd incorporation. The results indicate that cadmium can be successfully incorporated in zinc oxide thin films to achieve structural changes in the properties of films. Springer-Verlag GmbH Germany, part of Springer Nature 2018.
URI: http://idr.nitk.ac.in/jspui/handle/123456789/10715
Appears in Collections:1. Journal Articles

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